see it here By W. Richard Bowen
http://mortimer.ca/?m=20130907 This is often the 1st publication to compile either the fundamental concept and confirmed approach engineering perform of AFM. it's provided in a manner that's obtainable and helpful to training engineers in addition to to people who are enhancing their AFM talents and information, and to researchers who're constructing new items and strategies utilizing AFM.
The booklet takes a rigorous and functional strategy that guarantees it really is at once appropriate to technique engineering difficulties. basics and methods are concisely defined, whereas particular merits for approach engineering are basically outlined and illustrated. Key content material contains: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the improvement of fouling resistant membranes; nanoscale pharmaceutical research; nanoengineering for mobile sensing; polymers on surfaces; micro and nanoscale rheometry.
- Atomic strength microscopy (AFM) is a crucial device for strategy engineers and scientists because it allows enhanced techniques and products
- the one booklet facing the idea and functional functions of atomic strength microscopy in method engineering
- offers best-practice assistance and event on utilizing AFM for procedure and product development
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see Additional resources for Atomic Force Microscopy in Process Engineering An Introduction to AFM for Improved Processes and Pro
G. P. Cleveland, M. A. E. Hillner, M. Bezanilla, M. Fritz, D. G. B. Prater, J. Massie, L. Fukunaga, J. Gurley, V. Elings, Tapping mode atomic force microscopy in liquids, Appl. Phys. Lett. 64 (13) (1994) 1738–1740.  Q. Zhong, D. Inniss, K. Kjoller, V. Elings, Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy, Surf. Sci. Lett. (1993) L688–L692.  I. Schmitz, M. Schreiner, G. Friedbacher, M. Grasserbauer, Phase imaging as an extension to tapping mode AFM for the identification of material properties on humidity sensitive surfaces, Appl.
As a matter of fact, the Gouy–Chapman theory has a rather serious defect, which is mainly a consequence of the neglect of the finite dimensions of the ions. 46 2. Measurement of Particle and Surface Interactions In dilute solutions, where the extension of the diffuse layer is considerable, this neglect is to some degree permissible; but in more concentrated electrolyte solutions, the picture in terms of the Gouy–Chapman model becomes incorrect in some essential details. Stern  modified the Gouy–Chapman model by taking into consideration the finite size of real ions, underlying the double layer theory for a solid wall by dividing the charges in liquid into two parts.
According to this theory, the average charge density at a given point can be calculated from the average value of the electrical potential at the same point with Boltzmann’s theorem. The electrical potential distribution can be related to the charge density with the aid of Poisson’s equation. As a matter of fact, the Gouy–Chapman theory has a rather serious defect, which is mainly a consequence of the neglect of the finite dimensions of the ions. 46 2. Measurement of Particle and Surface Interactions In dilute solutions, where the extension of the diffuse layer is considerable, this neglect is to some degree permissible; but in more concentrated electrolyte solutions, the picture in terms of the Gouy–Chapman model becomes incorrect in some essential details.